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Home / Technologies / JTAG: In-Circuit testing and programming

JTAG: In-Circuit testing and programming

JTAG (IEEE 1149.1 standard) widely used by semiconductor manufacturers for testing and debugging of electronic components. We use our proprietary JTAG solutions in embedded systems development.

Our JTAG software and hardware solutions allow:

  • PCB testing and verification for technology defects (linkage, interconnection, short circuit)
  • Configuration of programmable devices (microcontrollers, PLDs)
  • Configuration and programming of FLASH, EEPROM, FRAM
  • In-circuit debug and monitoring, OCD (On Chip Debug)
  • Functional verification (ASIC, FPGA)
  • Import and analysis of BSDL (Boundary Scan Description Language) files for chips of various manufacturers
  • SVF (Serial Vector Format) test suite creation for circuit testing